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Freescale i.MX51 CPU Support

Freescale i.MX51 CPU Support

Embedded systems built around the powerful and versatile i.MX51 applications processor rely on their strong central core to manage and control the surrounding peripherals, providing performance and efficiency for the most demanding applications. Why not leverage that same power to functionally test, verify, and program these peripherals - at speed and without requiring costly fixtures?

Corelis ScanExpress JET with i.MX51 CPU support utilizes the i.MX51 JTAG port to take full control of the ARM Cortex-A8 core, enabling fast and easy test development and execution of full Corelis functional test suite for supported peripherals.
 

	ScanExpress JET Freescale i.MX51 Peripheral List
	Device Type	Part/Model Number
	i.MX51	i.MX512, i.MX513, i.MX514, i.MX515, i.MX516
	Memory Interfaces (2)	DDR2, LPDDR2, LPDDR
	Flash Interfaces	SPI NOR, NAND (3)
	UART	Integrated
	I2C	Integrated
	PMIC	MC13892

(1) Part list is subject to change. Please contact Corelis for the most current list.
(2) Custom initialization scripts may be required.
(3) NAND Flash bad block management is not currently supported. Call for availability.
 

Standard Tests

Freescale i.MX51 CPU Support for ScanExpress JET includes automatic test generation for commonly used peripherals.

• CPU Initialization - Test basic communication and functions of the CPU.

• SDRAM - Execute a full suite of at-speed SDRAM tests to catch hard-to-find faults.

• Serial NOR Flash - Test and program serial Flash using maximum CPU clock speed.

• I2C Discovery - Scan the I2C bus to identify and communicate with connected devices.

• UART Loopback - Verify UART communication via a simple loopback cable.

• Ethernet Loopback - Test Ethernet functions using a simple loopback cable.

• Power Management IC (PMIC) - Ensure that the power management system is fully functional.

Custom Tests

The ScanExpress JET development system includes a powerful scripting language and integrated script debugger; write your own tests or load compiled code right from the JET integrated development environment.

Features, pricing, availability, and specifications are subject to change without notice.

For complete information on ScanExpress JET, please refer to the detailed datasheet for this product.

To speak with a Sales Engineer, please click here.

Success Story

	Read how Fluke used JTAG Embedded Test tools on the i.MX processor with their new Process Calibration line of products. JET Enhances Process Calibration Equipment Testability

ScanExpress JET 13 Point Benefit

	The JTAG Embedded Test (JET) method extends coverage beyond popular boundary-scan techniques to virtually every signal of the UUT that is accessible by on-board CPU(s). This includes most of the remaining non-scannable, analog and I/O port resources.  Click Here for a list of some important JET Benefits.

Need Assistance?

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