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Home > Products > JTAG Boundary-Scan Products > JTAG Test and Programming Hardware > JTAG Boundary-Scan Controllers > USB-1149.1/CFM

         
 


USB-1149.1/CFM

High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers

The USB-1149.1/CFM™ High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation™ and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.

Adding boundary-scan without losing the ICT investment is an attractive prospect—by combining ICT and boundary-scan, test engineers are achieving the benefits of these complementary technologies and the highest possible test coverage.

For complete information on this controller, please refer to the detailed datasheets.

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USB-1149.1/CFM - High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers
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