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USB-1149.1/CFM
High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers
The USB-1149.1/CFM™ High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation™ and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
Adding boundary-scan without losing the ICT investment is an attractive prospect—by combining ICT and boundary-scan, test engineers are achieving the benefits of these complementary technologies and the highest possible test coverage.
For complete information on this controller,
please refer to the detailed datasheets.
To speak with a Sales
Engineer, please click here.
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