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IEEE-1149.6 Support

For ScanExpress Tools

The ScanExpress automatic test development suite provides full support for the IEEE-1149.6 standard by scanning a PCB netlist to detect, model, and classify devices involved in AC-coupled circuit topologies. IEEE-1149.6 tests are generated automatically and transparently for the user, providing a seamless solution.

Test Development Automation with ScanExpress

Using a combination of auto-detection, filtering, and parametric search, ScanExpress tools can identify key elements of IEEE-1149.1 and IEEE-1149.6 circuit topologies, including:

  • 1149.1 & 1149.6 Components

  • Series, Pull-up, Pull-down, & Termination Resistors

  • Power, Ground, & Intermediate Voltages

  • Series Capacitors

What is IEEE-1149.6?

Ratified in 2003, IEEE-1149.6 provides support for boundary-scan testing of high speed AC-coupled interconnects.

  • AC Coupled Nets
    IEEE-1149.1 was designed for DC interconnects and does not address high speed AC coupled signals. 1149.6 expands on 1149.1 by providing a standard method for testing across AC coupled nets.

  • Differential Nets
    IEEE-1149.6 introduces new features to expand test coverage and address complex circuit topologies associated with high speed differential signals.

IEEE-1149.6

The proliferation of high speed serial interfaces in modern printed circuit board designs created a challenge that existing test methodologies could not address. The IEEE-1149.6 standard was developed to address that challenge by modifying the existing boundary-scan architecture and introducing test coverage on AC-coupled differential interconnections between ICs (integrated circuits). Utilizing the existing JTAG interface, IEEE-1149.6 provides the least intrusive methodology to test these advanced digital networks.


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Advanced Digital Network Testing with IEEE-1149.6

IEEE-1149.6




Related Tools:

ScanExpress TPG


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