For Immediate Release

Corelis Introduces Boundary-Scan Test Support for High-Speed
AC-Coupled Interconnects (per IEEE-1149.6 Standard)

ScanExpress Tools  v1.04 Extends Boundary-Scan Testing to High-Speed Circuits

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Charlotte, NC – October 26, 2004 – Corelis, Inc. today at the International Test Conference introduced the first PC-based Boundary-Scan testing system to support boundary-scan testing of high-speed AC-Coupled Interconnects based on the new IEEE-1149.6 standard. The IEEE-1149.6 standard was developed to address the need to extend boundary-scan test methodologies to the AC-coupled interconnects between ICs (integrated circuits) that are increasingly being designed into high-speed networking equipment.  Adding boundary scan testing of AC-coupled signals extends easy to use boundary-scan board integrity testing to the new frontier of high-speed signals that until now were difficult to test.

Corelis has added initial support for IEEE-1149.6 to its industry-leading ScanExpress Tools suite.   ScanExpress Tools v1.04 now enable customers to develop test procedures using enhanced boundary-scan methods to detect common interconnect faults on IEEE-1149.6 compatible circuits.  The ScanExpressTPG Automatic Test Pattern Generator now supports IEEE-1149.6-specific BSDL and cell features and provides test coverage of capacitive-coupled single-ended and differential signals. 

 “Our customers are increasingly implementing new high-performance designs that incorporate AC-coupling and differential signaling using IEEE-1149.6 compatible devices,” said Carmy Yellin, Vice-President of Technology for Corelis. “They have experience and are familiar with the benefits of boundary-scan testing and want to extend these to their new products. ScanExpress Tools v1.04 enables them to do this.”

The ScanExpress Tools version 1.04 CD-ROM is now available for customer installation and is fully upwards compatible with all ScanPlus and ScanExpress software.

Corelis Inc. offers a broad line of boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation. Corelis’ ScanPlus and ScanExpress Boundary-Scan systems are used for interconnect testing as well as in-system programming of Flash memories, CPLDs and FPGAs. Corelis’ systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, PCMCIA and VXI host interfaces. Corelis also offers a full-line of JTAG emulation and debugging tools. Corelis provides custom test engineering services and is well known for its outstanding customer support.

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