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Corelis Launches Runner-Lite: The Free JTAG Test Executive

New Tool Offers Complete Structural and Functional Test Solutions for Reference Designs.

Jump to Runner-Lite Product Page

Cerritos, CA, September 13, 2010 – Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced today the availability of Runner-Lite, a free software test executive for performing boundary-scan testing, JTAG Embedded Testing (JET), and in-system device programming using pre-generated test plan files built for specific reference boards.

Runner-Lite is designed to provide engineers visibility, awareness, and accessibility to board level JTAG and functional testing. The Runner-Lite test executive applies boundary-scan test patterns to a reference board, reads back the responses, and provides comprehensive fault detection and isolation of boundary-scan chain infrastructure, board interconnect, pull-up/pull-down resistors, and clusters such as memories and UARTs. The tool also performs automated and interactive functional tests on peripheral components connected to the on-board processor as well as In-System-Programming (ISP) of CPLDs, Flash memories, and serial EEPROM devices.

The software includes a powerful graphical fault identification subsystem to isolate and visualize the location of PCB faults. The subsystem displays a CAD-based photographic representation of a reference design on the host PC display to facilitate the rapid discovery of the actual location for any failure, even when the fault is hidden underneath devices. This feature grants engineers the ability to visually locate the fault diagnostic area using the virtual PCB representation.

“Runner-Lite offers a simple and streamlined interface for companies looking to evaluate the capabilities of combined JTAG and functional based testing,” states Ryan Jones, Senior Technical Marketing Engineer at Corelis. “Users can download the software and execute a full suite of boundary-scan and functional tests in a matter of minutes.”

Runner-Lite offers unrestricted access to complete off-the-shelf JTAG structural and functional test solutions for many popular silicon vendor reference designs. It allows users to familiarize themselves with Corelis test capabilities and even use the tool as a test bench for their own reference board based designs. The software is offered at no charge and can be downloaded from the Corelis website. Visit http://www.corelis.com/runner-lite for more information.

About Corelis

Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Corelis’ development and test tools are used by companies such as Agilent, Dell, IBM, Jabil, Intel, Microsoft, Lockheed Martin, Rockwell Collins, Hewlett-Packard, Motorola, Qualcomm, Nokia, Panasonic, TI, Ford, Plexus, Broadcom, Ericsson, Flextronics, and many others. Corelis products are found globally in every industry developing or manufacturing electronic products.

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The Runner-Lite Interface

Runner-Lite Editorial

	Read more about Runner-Lite in this article from the 2011 Embedded Processing & DSP Resource Guide from Texas Instruments.

Media Contact

Ryan Jones
Senior Technical Marketing Engineer
+1 (562) 926-6727 (International)
+1 (888) 808-2380 (U.S. & Canada)
+1 (562) 404-6196 fax
Ryan.Jones@corelis.com